Year of Publication 2021 Authors M. Cecchetto, R. Garcia Alia, F. Wrobel, A. Coronetti, K. Bilko, D. Lucsanyi, S. Fiore, G. Bazzano, E. Pirovano, and R. Nolte Link to Archive (URL) https://ieeexplore.ieee.org/abstract/document/9373367 Open Access Yes Type of Electronic Component SRAM Test Facility CHARM Radiation Effect SEU Document Type Scientific publication
