Year of Publication 2018 Authors M. Cecchetto , R. García Alía , S. Gerardin , M. Brugger, A. Infantino , and S. Danzeca Link to Archive (URL) https://ieeexplore.ieee.org/document/8352861 Open Access Yes Type of Electronic Component SRAM Test Facility CHARM Accelerator LHC Radiation Effect SEL SEU Document Type Scientific publication