Year of Publication 2018 Authors Glorieux, Maximilien, Adrian Evans, Thomas Lange, A-Duong In, Dan Alexandrescu, Cesar Boatella-Polo, Rubén García Alía et al Link to Archive (URL) https://ieeexplore.ieee.org/document/8584296 Open Access Yes Type of Electronic Component SRAM based FPGA Test Facility North Area heavy ion beam Radiation Effect SEL SEU Document Type Data Workshop Paper
