Year of Publication 2022 Authors A. Coronetti, R. Garcia Alia, M. Letiche, C. Cazzaniga, M. Kastriotou, M. Cecchetto, K. Bilko, P. Martin-Holgado Link to Archive (URL) https://ieeexplore.ieee.org/abstract/document/9679344 Open Access IEEE TNS Type of Electronic Component SRAM Test Facility CALLAB ILL Radiation Effect SEU Document Type Data Workshop Paper
