Analysis of Bipolar Integrated Circuit Degradation Mechanisms Against Combined TID–DD Effects | r2e.web.cern.ch

Year of Publication

2021

Authors

R. Ferraro, R. Garcia Alia, S. Danzeca, A. Masi

Link to Archive (URL)

https://ieeexplore.ieee.org/abstract/document/9438611

Open Access

Yes

Test Facility

Document Type

Scientific publication