Year of Publication 2021 Authors A. Coronetti, R. Garcia Alia, F. Cerutti, W. Hajdas, D. Söderström, A. Javanainen, F. Saigné Link to Archive (URL) https://ieeexplore.ieee.org/abstract/document/9391686 Open Access Yes Type of Electronic Component SRAM Test Facility CHARM Radiation Effect SEL Document Type Scientific publication