How the Analysis of Archival Data Could Provide Helpful Information about TID Degradation. Case Study: Bipolar Transistors
Year of Publication
2022
Authors
P. Martin-Holgado, A. Romero-Maestre, j. De-Martin-Hernandez, J. Gonzalez-Lujan, I. Illera-Gomez, Y. Jimenez-de-Luna, F. Morilla, M. Sacristan-Barbero, R. Garcia-Alia, M. Dominguez, Y. Morilla
