Radiation Hardness Assurance Through System-Level Testing: Risk Acceptance, Facility Requirements, Test Methodology, and Data Exploitation

Year of Publication
2021
Authors
Andrea Coronetti, Rubén García Alía, Jan Budroweit, Tomasz Rajkowski, Israel Da Costa Lopes, Kimmo Niskanen, Daniel Söderström, Carlo Cazzaniga, Rudy Ferraro, Salvatore Danzeca, Julien Mekki, Florent Manni, David Dangla, Cedric Virmontois,
Nourdine Kerboub, Alexander Koelpin, Frederic Saigné, Pierre Wang, Vincent Pouget, Antoine Touboul, Arto Javanainen, Heikki Kettunen, and Rosine Coq Germanicus
Link to Archive (URL)
https://ieeexplore.ieee.org/abstract/document/9360625
Open Access
Yes
Test Facility
CHARM
Radiation Effect
SEL
SEU
Document Type
Scientific publication

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