Fragmented High-Energy Heavy-Ion Beams for Electronics Testing

Year of Publication
2023
Authors
Rubén García Alía, Kacper Bilko, Francesco Cerutti, Andrea Coronetti, Natalia Emriskova, Luigi Esposito, Francesc Salvat Pujol, Andreas Waets, Sylvain Girard, Frédéric Saigné, Marco Durante, Christoph Schuy, Tim Wagner
Link to Archive (URL)
https://ieeexplore.ieee.org/abstract/document/9912355
Open Access
Yes
Type of Electronic Component
SRAM
Radiation Monitor Tags
Silicon diode
Radiation Effect
SEU
Document Type
Scientific publication

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