Year of Publication 2022 Authors G. Lerner, A. Coronetti, J. Kempf, R. Garcia-Alia, F. Cerutti, D. Prelipcean, M. Cecchetto, A. Gilardi, W. Farabolini, R. Corsini Link to Archive (URL) https://ieeexplore.ieee.org/abstract/document/9729860 Open Access Yes Type of Electronic Component SRAM Test Facility CLEAR Radiation Effect SEU Document Type Scientific publication
